第二届雷达与成像技术国际会议(ICRIT 2019)

第二届雷达与成像技术国际会议(ICRIT 2019)
The 2nd Int'l Conference on Radar and Imaging Technology (ICRIT 2019)

大会时间: 2019年7月19-21日
大会地点: 桂林
大会官网: http://www.confjuly.org/conference/ICRIT2019/
在线注册: http://www.confjuly.org/RegistrationSubmission/default.aspx?ConferenceID=1125

演讲嘉宾
Prof. GuiYun Tian, Newcastle University, UK
Prof. Yizhou Yu, University of Hong Kong, China
Dr. Ahmed Abdelgawad, Central Michigan University, USA
Prof. Gongjian Zhou, Harbin Institute of Technology, China
Dr. Junichi Takiguchi, Mitsubishi Electric Corporation, Japan
Prof. Longfei Shi, National University of Defense Technology, China
Dr. Jibin Zheng, National Laboratory of Radar Signal Processing, Xidian University, China

文章出版

出版物：Computer and Communications 领域开源期刊 
检索类型：知网及谷歌学术收录
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联系方式

联系人: 张老师 
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大会议题

会议征稿范围包含但不限于以下领域： 

Radar Phenomenology 
Radar Systems 
Advanced Subsystems/Components 
Radar Design and Simulation 
SAR/ISAR/Ultra-wideband Radar 
Passive/Noise/Cognitive/MIMO Radars 
Waveform Diversity 
Signal and Data Processing 
Computer Modeling 
Environment Sensing and Modeling
Advanced RF and Antenna Technologies 
Space Technology and Remote Sensing 
Synthetic Aperture Techniques 
Radar Imaging Technology 
Emerging Technologies 
Threats and Countermeasures 
Radar Applications