International Workshop on Reliability Engineering and Risk Management (IWRERM’08)
Call for papers
August 21-22, 2008, Tongji University, Shanghai, China
Objective
Reliability engineering and risk management have been attracting increasing attention and attached growing importance in civil, mechanical, aerospace and aeronautics, offshore and marine engineering, as well as in many other disciplines of engineering. In this background, the aim of the First International Workshop on Reliability Engineering and Risk Management (IWRERM’08) is to bring the researchers, experts and engineers all over the world together to present and discuss innovative methodologies and the practical applications of these technologies in the field of reliability engineering and risk management. Emerging concepts as well as state of the art and novel applications of reliability principles and risk based decision making in all types of structures, infrastructures and mechanical components will be included. In this context, papers on theories, methods, algorithms, and applications are all welcome.
Topics
The following are areas of special interest, but not limited to:
· Bridges and Buildings
· Damage Analysis and Assessment
· Durability
· Life-cycle Analysis
· Fatigue Reliability
· Lifeline engineering and network
· Natural and Man-made Hazards
· Random Vibration and Stochastic Mechanics
· Reliability Theory
· System Reliability
· Reliability-based Design and Regulations
· Reliability-based Optimization and Control
· Performance-based Design Methods
· Uncertainty Quantification and Risk Assessment Models
· Insurance and Management of Risk
· Risk-Based Decision Making
· Risk Management Methods
· Time-dependent Reliability
Important dates
Dead line of abstract submission: |
May 01, 2008 |
Notification of acceptance: |
May 15, 2008 |
Final paper submission: |
Aug 21, 2008 |
Submission and Publication
Abstracts of about 300 words on any of the above topics are invited by May 1, 2008. All abstracts and full papers must be submitted electronically in MS-WORD format to IWRERM08@mail.tongji.edu.cn. The e-mail message should include the authors' full names, affiliations and the full title of the paper. Each presenting participant can submit only one manuscript. Detailed instructions will be available at the conference website www.iwrerm08.cn. Each paper will be reviewed by at least two reviewers. The paper must be well written with acceptable English exposition, contains an informative introduction section with clear motivations. Accepted papers will be published in a special volume of the Workshop Proceedings by Tongji University Press with international standard book number (ISBN).
International Advisory Committee
A.H.S. Ang,
D.M. Frangopol, Lehigh University, Bethlehem, PA, USA (Co-Chair)
O. Ditlevsen, Technical
R.E. Melchers,
J. Kanda,
T. Ono, Nagoya Institute of Technology,
W.H. Tang,
G.F. Zhao,
Xila Liu,
Hyo-Nam Cho,
Hitoshi Furuta,
Sang-Hyo Kim,
Bruce Ellingwood, Georgia Inst. of Technology,
Armen Der Kiureghian,
International Scientific Committee
J. Li,
A.H.S. Ang,
H.N. Cho,
O. Ditlevsen, Technical
B.R. Ellingwood, Georgia Institute of
M. Faber, ETH, Zurich, Switzerland
D.M. Frangopol, Lehigh University, Bethlehem, PA, USA
H. Furuta,
H.P. Hong,
J. Kanda,
K.K. Phoon, National
M. Lemaire, IFMA, Clermont-Ferrand, France
S. Mahadevan, Vanderbilt University, Nashville, TN, USA
R.E. Melchers,
Y. Mori,
T. Ono, Nagoya Institute of Technology,
R. Rackwitz, Technical
G.
T. Takada,
W.H. Tang,
Y.K. Wen,
C.B. Yun, KAIST,
Y. Zhao, Nagoya Institute of Technology,
W.Q. Zhu,
J.L. Beck, California Institute of Technology, Pasadena, CA, USA
L.A. Bergman, University of Illinois, Urbana, IL, USA
C. Bucher, Vienna University of Technology, Vienna, Austria,
M.K. Chryssanthopoulos, University of Surrey, Guilford, UK
M. Ciampoli, University of Rome "La Sapienza", Rome, Italy
J.P. Conte, University of California, San Diego, CA, USA
A.C. Estes, California Polytechnic State University, San Luis Obispo, CA, USA
L. Esteva, National University of Mexico, Mexico City, Mexico
M. Ghosn, City University of New York, New York, NY, USA
M. Gioffrè, University of Perugia, Perugia, Italy
L. Graham-Brady, Johns Hopkins University, Baltimore, MD, USA
A. Haldar, University of Arizona, Tucson, AZ, USA
S. Hanayasu, Yokohama National University, Yokohama, Japan
M. Holicky, Czech Technical University, Prague, Czech Republic
J.B. Chen,
Z.H. Lu, Nagoya Institute of Technology,
H.A. Jensen, Santa Maria University, Valparaiso, Chile
A. Kiremidjian, Stanford University, Palo Alto, CA, USA
C.G. Koh, National University of Singapore, Singapore
T. Moan, Norwegian University of Science and Technology, Trondheim, Norway
D. Novak, Brno University of Technology, Brno, Czech Replublic
A.S. Nowak, University of Nebraska, Lincoln, NE, USA
M. Pandey, University of Waterloo, Waterloo, Ontario, Canada
M. Papadrakakis, National Technical University of Athens, Athens, Greece
U. Peil, Technical University of Braunschweig, Braunschweig, Germany
J.D. Riera, UFRGS, Porto Alegre, Brazil
H. Sandi, Institute of Geodynamics of the Romanian Academy, Bucharest, Romania
W. Shiraki, Kagawa University, Takamatsu, Japan
K. Sobczyk, Polish Academy of Sciences, Warsaw, Poland
C. Soize, University of Marne-Vallée, La Vallée, France
T.T. Soong, State University of New York, Buffalo, NY, USA
M.G. Stewart, University of Newcastle, Newcastle, Australia
D. Val, Technion, Haifa, Israel
J.M. van Noortwijk, HKV Consultants and TU Delft, Delft, The Netherlands
W.L.Jin, Zhejiang University, China
Q.X.Wu, Hohai University, China
Z.Z.Lv, Northwestern Polytechnical University, China
B.Huang, Wuhan University of Technology, China
Symposium Organization Committee
Chairman: Prof. Jie Li (
Vice-chairman: Prof. Yangang Zhao (Nagoya Institute of
Sponsors
AIJ,
Post-symposium tour
Further information can be found at http://www.shanghai.gov.cn/.
Fees
The registration fee for presenters is US$400. The registration fee will cover attendance at all sessions of the symposium, symposium teas and lunches, one set of the published symposium proceedings, the welcome reception and the symposium dinner as well as tour around
Copyright(C) IWRERM 2008